cGMP compliance status of DANNALAB confirmed during the inspection of the Dutch Health Care Inspectorate - aug 2021
"ADVANCED XRPD SYSTEM FOR THE CHARACTERIZATION OF PHARMACEUTICAL COMPOUNDS"; V.A. Kogan, PANalytical B.V. & DANNALAB; D.Beckers, PANalytical B.V., Almelo, The Netherlands
"Use of Cleaning Algorithm for Model-Free Correction of Instrumental Aberrations in XRPD Patterns";V.A.Kogan, DANNALAB B.V.; D.Beckers, A.Kharchenko, Malvern Panalytical B.V., Almelo, PPXRD meeting, Switzerland, May 2019;
"Instrumental Effects in Laboratory Pair Distribution Function (PDF) Analysis"; M.Gateshki, D.Beckers, Malvern Panalytical B.V., V.A. Kogan, DANNALAB B.V.; ECM meeting, Vienna, Aug 2019;
GMP compliance status of DANNALAB confirmed during the inspection of IGJ (The Dutch Health Care Inspectorate) - June 2018.
Presentation at Nanotech 2018, Tokyo, Japan
"Evidence for Intramolecular Antiparallel β-Sheet Structure in α-Synuclein Fibrils..."; Nature Coomunications (in press); Roeters S., Iyer A.,Pletikapic G., Subramaniam V., Woutersen S., Kogan V.
Nanotech 2017, Tokyo, Japan
Empyrean Nano: A Versatile X-ray Scattering Instrument Enabling USAXS, SAXS, WAXS and PDF; Denver X-Ray conference; Bolze J., Beckers D., Gateshki M., Masiello F., Fransen M., PANalytical B.V., Kogan V. DANNALAB B.V.
Non-ambient SAXS camera for characterization of nano-particles and biopolymers; Nanocity 2016 Amsterdam, V.Kogan DANNALAB B.V., Beckers D., Reuvekamp E. PANalytical B.V.
BIoSAXS presentation; AAPS 2016 Colorado; Bolze J., Beckers D.,PANalytical B.V., V.Kogan, DANNALAB B.V.
Nanotech 2016, Tokyo, Japan
Characterization of protein solutions using SAXS on a multi-purpose laboratory X-ray diffractometer 2015 -
EBSA 2015 Congress J. Bolze, D. Beckers, PANalytical B.V.; V. Kogan DANNALAB B.V.
A versatile laboratory X-ray diffractometer platform enabling USAXS, SAXS, WAXS and PDF measurements within a q -range of almost five decades
SAS2015 conference, Bolze J., Beckers D., Gateshki M., Sommariva M., Masiello F., Fransen M.,PANalytical B.V.; Kogan V. DANNALAB B.V.
"New X-Ray Methodology for Structural Characterisation of Amyloid Fibrils"; Nanofabrique 2015; Iyer A., Subramaniam V. AMOLF, Kogan V.DANNALAB B.V.
GMP compliance status of DANNALAB confirmed during the inspection of IGZ (The Dutch Health Care Inspectorate) - dec 2014
"Development of ERM for nanoparticulates" short presentation - V.A.Kogan, DANNALAB B.V., RIVM workshop, Bilthoven, Nov 2014
"X-Ray methodology for studying protein aggregation" V. Kogan, DANNALAB B.V., Nanocity 2014, Nov 2014
"Multi-purpose X-ray diffractometer platform with versatile SAXS/WAXS options" D.Beckers, J. Bolze, E.Reuvekamp, PANalytical B.V., V. Kogan, DANNALAB B.V., Nanocity 2014, Nov 2014
OECD GLP compliance status of DANNALAB confirmed during the inspection of IGZ (The Dutch Health Care Inspectorate) - oct 2014
"X-Ray Characterisation of Nanoparticulates within GxP Quality Framework" - V.A.Kogan, DANNALAB B.V., RIVM workshop, Bilthoven, Nov 2013
"SCATTERX78 - a high-performance SAXS/WAXS module integrated on a multipurpose X-Ray diffractometer platform" J. Bolze, M. Fransen, PANalytical B.V., V. Kogan, DANNALAB B.V., Denver X-Ray Conference, August 2013
"Accessing the higher-order molecular structure of bio-pharmaceuticals in non-crystalline state", V.A.Kogan, DANNALAB B.V., IWPCPS-15 2013, Philadelphia, June 2013
"X-Ray methodology for studying nanoscale protein aggregation in disease - 3A2 status", V.A.Kogan, DANNALAB B.V., NanoNext meeting 2013, Utrecht, June 2013
"Critical parameters for instrument alignment and performance verification of XRD instrumentation", D.Beckers, A.Kharchenko, T.Degen, M.Fransen PANalytical B.V., V.Kogan, DANNALAB B.V., APD IV at NIST, Gaithersburg, April 2013
"Multipurpose X-Ray diffractometer platform with versatile SAXS/WAXS options" J.Gertenbach, J.Bolze, D.Beckers, P.Munk, M.Fransen, PANalytical B.V., V.Kogan DANNALAB B.V., ImagineNano 2013 - NanoBioMed 2013, Bilbao, April 2013
"Multi-purpose X-ray diffractometer platform with versatile SAXS/WA XS options" J.Bolze, D.Beckers, P.Munk, M.Fransen, PANalytical B.V., V.A.Kogan, DANNALAB B.V., SAS 2012 conference, Sydney, November 2012
"Characterisation of active ingredient in formulation by differentiation of X-ray scattering patterns" V.A.Kogan, DANNALAB B.V., IWPCPS-14 conference, Barselona, June 2012
"SAXS characterisation of an HIV fusion inhibitor in serum and plasma formulations" V.A.Kogan, DANNALAB B.V.; H.N. de Armas, K. Amssoms, P. Neeskens, M. Bernini, J. Van Gelder, Johnson & Johnson Pharmaceutical Research & Development; D. Beckers, E. Reuvekamp, PANalytical B.V.; TIDES conference, Las Vegas, May 2012
"X-Ray methodology for monitoring of protein aggregation in solution" V.A.Kogan, DANNALAB B.V.; M. M. A. E Claessens, S.Semerdzhiev, V. Subramaniam, NBP TNW Utwente; MicroNanoConference, Enschede, nov 2011
"X-rays exploring the nano domain: an unique combination of SAXS and XRD" P.Munk, J.Bolze, E.Reuvekamp, PANalytical B.V.; V.Kogan, DANNALAB B.V. MicroNanoConference, Enschede, nov 2011
ICSE exhibition in Frankfurt, oct 2011
Presentation at "Nanoscale Biomolecular Interactions in Disease" group meeting of NanoNextNL program, FOM/STW office, Utrecht, 2011
"Nanomaterials Characterisation by Small-Angle X-ray Scattering Applied on a Multi-Purpose X-Ray Diffractometer Platform", J.Bolze, PANalytical B.V., V.A.Kogan, DANNALAB B.V.; INSC 2011; Malaisya;
"Characterisation of nanoparticles and biopolymers by Small Angle X-Ray Scattering", V.A.Kogan, MicroNanoConference, Enschede, 2010
"Nanoparticle size distribution determination by small-angle X-Ray scattering on a multi-purpose X-ray diffractometer platform"; Particle & Molecular Characterisation Summit, Boston, 2010; J.Bolze, K.Macchiarola, B.Litteer, PANalytical B.V.; V.Kogan, DANNALAB B.V.
"XRPD Quantification of polymorph impurities in finished drug product"; IWPCPS-12, V.Kogan, DANNALAB B.V.;
"Analysis of nanoparticles, nanocomposites and nanosized pores by small-angle X-ray scattering..."; Nanofair Dresden; J.Bolze, D. Beckers, PANaytical B.V.; V.Kogan, DANNALAB B.V.;
"X-Ray detection in packaging", US Patent 20090232276, European Patent EP2090883, Beckers D.; Kogan V.; Bolze J.; Lehmann C.W.; Schweim H.G.; Steffens K.
"X-ray diffraction equipment for X-ray scattering", US patent 7542547; Kogan V.;
"Apparatus and method for correcting for aberrations" US patent 7516031; Kogan V.;
"Characterisation of Nanoparticles and Nanosized Pores by X-Ray Diffractometry and Small-Angle X-Ray Scattering (SAXS)", NEVAK, J. Bolze, D. Beckers, P. Munk, PANalytical B.V.; V. Kogan, Dannalab;
Presentation, NANOTECH Berlin 2009, J. Bolze, D. Beckers, P. Munk, PANalytical B.V., The Netherlands, V. Kogan, Dannalab;
MicroNano Conference, Ede (The Netherlands) Presentation: "SAXS for nanoparticle and pore size analysis on a multi-purpose powder diffractometer", J. Bolze, D. Beckers, V. Kogan Poster: "Determination of specific surface area and size distribution by small-angle X-ray scattering", J. Bolze, D. Beckers, V. Kogan
Lunteren Meeting (The Netherlands) of the “CW studiegroepen” Kristal en Structuuronderzoek en Vaste Stof Chemie en Materiaalkunde Presentation: "Determination of Specific Surface Area and Nanoparticle Size Distribution by SAXS", J. Bolze, D. Beckers, V. Kogan Poster: "Determination of specific surface area and size distribution by small-angle X-ray scattering", J. Bolze, D. Beckers, V. Kogan
Nanofair Dresden (Germany): "Determination of specific surface area and size distribution by small-angle X-ray scattering", J. Bolze, D. Beckers, V. Kogan
The Academy of Pharmaceutical Sciences, Seminar in Bath (UK): Amorphous Materials, Challenge or Opportunity? An insight into preparing, analysis, use and control of amorphous materials. "Determination of specific surface area and size distribution by small-angle X-ray scattering", P. O'Meara, J. Bolze, D. Beckers, V. Kogan
2008 APEC Nanoscale Measurement Technology Forum: "Determination of Specific Surface Area and Nanoparticle Size Distribution by SAXS", U. Tiwari, J. Bolze, D. Beckers, V. Kogan
10th International conference on Physical Characterisation of Pharmaceutical Solids, Bamberg, "Development and Validation of Quantitative Methods using XRPD" V.Kogan DANNALAB, D.Beckers PANalytical B.V.; poster: "Counterfeit analysis of pharmaceutical substances" D.Beckers and J.Bolze PANalytical B.V., V.Kogan DANNALAB
4th European Symposium - Polymorphism and Patents, IQPC, Frankfurt "X-Ray scattering signatures for the characterisation of drug substances" V.Kogan DANNALAB, D.Beckers PANalytical B.V.,
10th European Symposium on Controlled Drug Delivery, Nordwijk on Zee "Characterisation of delivery systems by small-angle X-ray scattering " J.Bolze and D.Beckers PANalytical B.V., V.Kogan DANNALAB
Pharmaceutical Powder X-ray Diffraction Symposium (PPXRD-7), Florida "Determination of specific surface area and size distribution by small-angle X-ray scattering", J.Bolze and D.Beckers PANalytical B.V., V.Kogan DANNALAB
Meeting of the Industrial group of British Crystallographic Association, ESRF, Grenoble, 2007 ; "SAXS experiments within conventional XRD instrument", V.A.Kogan, DANNALAB
Ninth International conference on Physical Characterisation of Pharmaceutical Solids (IWPCPS-9) Boston, 2007, "Characterisation of formulations and drug products by PXRD", V.Kogan DANNALAB, D.Beckers adn J.Nicolich PANalytical B.V.
Pharmaceutical Powder X-ray Diffraction Symposium (PPXRD-6), Barcelona, 2007, "XRPD for nondestructive characacterization of solid dosage forms", V.Kogan DANNALAB, D.Beckers and T.Degen PANalytical B.V
European Powder Diffraction Conference, Geneve, 2006--- "Model-free aberration correction", V.A.Kogan DANNALAB
Denver X-Ray Conference, Denver, 2006-- "System for spatially resolved HRXRD" , V.A.Kogan DANNALAB, A.V.Kharchenko PANalytical B.V.
Pharmaceutical Powder X-ray Diffraction Symposium (PPXRD-5), New York, 2006--- "Advanced XRPD System for the Characterisation of Pharmaceutical Compounds", V.A.Kogan, DANNALAB, D.Beckers PANalytical B.V.
